Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM

Duan, M.M.DuanZhang, J. F.J. F.ZhangJi, Z.Z.JiMa, J. G.J. G.MaZhang, W.W.ZhangKaczer, BenBenKaczerSchram, TomTomSchramRitzenthaler, RomainRomainRitzenthalerGroeseneken, GuidoGuidoGroesenekenAsenov, A.A.Asenov2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22286Key issues and techniques for characterizing time-dependent device-to-device variation of SRAMProceedings paper