Celano, UmbertoUmbertoCelanoLee, Y.Y.LeeSerron, JillJillSerronSmith, ColeColeSmithFranco, JacopoJacopoFrancoRyu, K.K.RyuKim, M.M.KimPark, S.S.ParkLee, J.J.LeeKim, J.J.Kimvan der Heide, PaulPaulvan der Heide2021-12-092021-11-022021-12-0920210038-1101WOS:000709200800014https://imec-publications.be/handle/20.500.12860/37420Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxidesJournal article10.1016/j.sse.2021.108136WOS:000709200800014