In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories

Subirats, AlexandreAlexandreSubiratsArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschDegraeve, RobinRobinDegraeveLinten, DimitriDimitriLintenFurnemont, ArnaudArnaudFurnemont2021-10-232021-10-232016-05https://imec-publications.be/handle/20.500.12860/27360In depth analysis of post-program VT instability after electrical stress in 3D SONOS memoriesProceedings paper