Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers

Pinardi, KuntjoroKuntjoroPinardiJain, UmaUmaJainJain, SureshSureshJainMaes, HermanHermanMaesVan Overstraeten, RogerRogerVan OverstraetenWillander, M.M.Willander2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2865Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layersJournal article