Nissimoff, AlbertAlbertNissimoffMartino, Joao A.Joao A.MartinoAoulaiche, MarcMarcAoulaicheVeloso, AnabelaAnabelaVelosoWitters, LiesbethLiesbethWittersSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-222021-10-2220140741-3106https://imec-publications.be/handle/20.500.12860/24325Spike anneal peak temperature impact on 1T-DRAM retention timeJournal articlehttp://ieeexplore.ieee.org/xpl/abstractAuthors.jsp?reload=true&arnumber=6811203&sortType%3Dasc_p_Sequence%26filter%3DAND(p_Publi