Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann, ClaudiaClaudiaFleischmannConard, ThierryThierryConardHavelund, RasmusRasmusHavelundFranquet, AlexisAlexisFranquetPoleunis, ClaudeClaudePoleunisVoroshazi, EszterEszterVoroshaziDelcorte, ArnaudArnaudDelcorteVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-2220140142-2421https://imec-publications.be/handle/20.500.12860/23821Fundamental aspects of Arn+ SIMS profiling of common organic semiconductorsJournal articlehttp://onlinelibrary.wiley.com/doi/10.1002/sia.5621/abstract