Interface and border traps in Ge-based gate stacks

Nyns, LauraLauraNynsLin, DennisDennisLinBrammertz, GuyGuyBrammertzBellenger, FlorenceFlorenceBellengerShi, XiaopingXiaopingShiSioncke, SonjaSonjaSionckeVan Elshocht, SvenSvenVan ElshochtCaymax, MattyMattyCaymax2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19496Interface and border traps in Ge-based gate stacksProceedings paper