Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation

Weckx, PieterPieterWeckxKaczer, BenBenKaczerKukner, HalilHalilKuknerRoussel, PhilippePhilippeRousselRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoorGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24808Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation – application to 6T SRAMProceedings paper