SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

Martin Martinez, JavierJavierMartin MartinezAmat, EsteveEsteveAmatBargallo Gonzalez, MireiaMireiaBargallo GonzalezVerheyen, PeterPeterVerheyenRodriguez, RosanaRosanaRodriguezNafria, MontseMontseNafriaAymerich, XavierXavierAymerichSimoen, EddyEddySimoen2021-10-182021-10-1820100026-2714https://imec-publications.be/handle/20.500.12860/17592SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistorsJournal article