Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology

Li, ZheyiZheyiLiBerti, LaurentLaurentBertiWouters, JanJanWoutersJialei, WangWangJialeiLeroux, PaulPaulLeroux2022-08-312022-07-312022-08-032022-08-3120220018-9499WOS:000828698900038https://imec-publications.be/handle/20.500.12860/40185Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS TechnologyJournal article10.1109/TNS.2022.3141070WOS:000828698900038Electrical & electronic engineeringCMOSSEEsSET