Brammertz, GuyGuyBrammertzLin, DennisDennisLinCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeynsPasslack, MatthiasMatthiasPasslack2021-10-172021-10-1720090003-6951https://imec-publications.be/handle/20.500.12860/15037On the interface state density at InGaAs/oxide interfacesJournal articlehttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000095000020202109000001&idtype=cvips&prog=normal