Model for the charge trapping in high permittivity gate dielectric stacks

Houssa, MichelMichelHoussaNaili, MohamedMohamedNailiHeyns, MarcMarcHeynsStesmans, AndreAndreStesmans2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5352Model for the charge trapping in high permittivity gate dielectric stacksJournal article