Charge transport and contact resistance characterization by the gated van der Pauw method

Rolin, CedricCedricRolinNowack, ThomasThomasNowackMuhieddine, KhalidKhalidMuhieddineJanneck, RobbyRobbyJanneckGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29320Charge transport and contact resistance characterization by the gated van der Pauw methodMeeting abstracthttps://mrsfall.zerista.com/event/member/427489?embedded=1