Rudenko, TamaraTamaraRudenkoKilchytska, ValeriaValeriaKilchytskaCollaert, NadineNadineCollaertJurczak, GosiaGosiaJurczakNazarov, AlexeyAlexeyNazarovFlandre, DenisDenisFlandre2021-10-162021-10-162007-09https://imec-publications.be/handle/20.500.12860/12818Substrate bias effect linked to parasitic series resistance in multiple-gate SOI MOSFETsJournal article