Hot hole induced damage in 1T-FBRAM on bulk

Aoulaiche, MarcMarcAoulaicheCollaert, NadineNadineCollaertMercha, AbdelkarimAbdelkarimMerchaRakowski, MichalMichalRakowskiDe Wachter, BartBartDe WachterGroeseneken, GuidoGuidoGroesenekenAltimime, LaithLaithAltimimeJurczak, GosiaGosiaJurczak2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18481Hot hole induced damage in 1T-FBRAM on bulkProceedings paper