Defect analysis in semiconductor materials based on p-n junction diode characteristics

Simoen, EddyEddySimoenClaeys, CorCorClaeysVanhellemont, JanJanVanhellemont2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12906Defect analysis in semiconductor materials based on p-n junction diode characteristicsJournal article