Zahedmanesh, HoumanHoumanZahedmaneshVarela Pedreira, OlallaOlallaVarela PedreiraTokei, ZsoltZsoltTokeiCroes, KristofKristofCroes2021-10-282021-10-2820190021-8979https://imec-publications.be/handle/20.500.12860/34510Investigating the electromigration limits of Cu nano-interconnects using a novel hybrid physics-based modelJournal articlehttps://doi.org/10.1063/1.5093769