Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

Wu, Cheng-HungCheng-HungWuRonchi, NicoloNicoloRonchiWang, Kuan-ChiKuan-ChiWangWang, Yu-YunYu-YunWangMcmitchell, SeanSeanMcmitchellBanerjee, KaustuvKaustuvBanerjeevan den Bosch, GeertGeertvan den Boschvan Houdt, JanJanvan HoudtWu, Tian-LiTian-LiWu2023-06-292023-06-202023-06-2920222168-6734WOS:000756799300019https://imec-publications.be/handle/20.500.12860/41885Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor CapacitorsJournal article10.1109/JEDS.2022.3141756WOS:000756799300019FIELDPOLARIZATIONMEMORY