Analytical model for failure rate prediction due to anomalous charge loss of Flash memories

Degraeve, RobinRobinDegraeveSchuler, FranzFranzSchulerLorenzini, MartinoMartinoLorenziniWellekens, DirkDirkWellekensHendrickx, PaulPaulHendrickxVan Houdt, JanJanVan HoudtHaspeslagh, LucLucHaspeslaghGroeseneken, GuidoGuidoGroesenekenTempel, GeorgGeorgTempel2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5231Analytical model for failure rate prediction due to anomalous charge loss of Flash memoriesProceedings paper