Combining TOFSIMS with XPS and AFM to quantify organic surface coverages

Kenens, ConnyConnyKenensConard, ThierryThierryConardVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4468Combining TOFSIMS with XPS and AFM to quantify organic surface coveragesOral presentation