Griffoni, AlessioAlessioGriffoniThijs, StevenStevenThijsRuss, ChristianChristianRussTrémouilles, DavidDavidTrémouillesLinten, DimitriDimitriLintenScholz, MirkoMirkoScholzCollaert, NadineNadineCollaertWitters, LiesbethLiesbethWittersMeneghesso, GaudentioGaudentioMeneghessoGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15399Next generation bulk FinFET devices and their benefits for ESD robustnessProceedings paper