Aoulaiche, MarcMarcAoulaicheKaczer, BenBenKaczerCho, Moon JuMoon JuChoHoussa, MichelMichelHoussaDegraeve, RobinRobinDegraeveKauerauf, ThomasThomasKaueraufAkheyar, AmalAmalAkheyarSchram, TomTomSchramRoussel, PhilippePhilippeRousselMaes, HermanHermanMaesHoffmann, Thomas Y.Thomas Y.HoffmannBiesemans, SergeSergeBiesemansGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/14903Positive and negative bias temperature instability in La2O3 and Al2O3 capped high-k MOSFETsProceedings paper