Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins

Vici, A.A.ViciPantisano, L.L.PantisanoRoussel, P. J.P. J.RousselChasin, A.A.ChasinFranco, J.J.FrancoKaczer, B.B.KaczerMeric, I.I.MericRamey, S. M.S. M.RameyDegraeve, R.R.DegraeveHicks, J.J.Hicks2026-05-112026-05-112025-10-060018-9383https://imec-publications.be/handle/20.500.12860/59396engUnified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability MarginsJournal article10.1109/ted.2025.3613295WOS:001591771200001MULTIPLE SOFT-BREAKDOWNGATE-OXIDE BREAKDOWNPROGRESSIVE BREAKDOWNSTATISTICAL DISTRIBUTIONVOLTAGE-DEPENDENCETHINMODELPREDICTIONACCURATEEVENTS