Single microparticle characterization using multi-wavelength lens-free imaging

Marien, JasperJasperMarienJayapala, MuraliMuraliJayapalaLambrechts, AndyAndyLambrechtsVan Hoof, ChrisChrisVan HoofYurt, AbdulkadirAbdulkadirYurt2024-12-112024-05-042024-12-1120242770-0208WOS:001209051500007https://imec-publications.be/handle/20.500.12860/43905Single microparticle characterization using multi-wavelength lens-free imagingJournal article10.1364/OPTCON.516373WOS:001209051500007MIE-SCATTERINGHOLOGRAPHIC MICROSCOPYPIXEL SUPERRESOLUTIONCOLLOIDAL PARTICLESRECONSTRUCTIONINDEXLIGHTSHOTSIZE