Gao, ZhanZhanGaoHu, Min-ChunMin-ChunHuBaert, RogierRogierBaertChehab, BilalBilalChehabSwenton, JoeJoeSwentonMalagi, SantoshSantoshMalagiHuisken, JosJosHuiskenGoossens, KeesKeesGoossensMarinissen, Erik JanErik JanMarinissen2024-08-062024-03-182024-08-0620242168-2356WOS:001168621300001https://imec-publications.be/handle/20.500.12860/43701Cell-Aware Test on Various Circuits in an Advanced 3-nm TechnologyJournal article10.1109/MDAT.2023.3294872WOS:001168621300001