Processing dependences of channel hot-carrier degradation on strained-S- p-channel metal-oxide semiconductor field-effect transistors

Amat, E.E.AmatMartin-Martinez, J.J.Martin-MartinezBargallo Gonzalez, MireiaMireiaBargallo GonzalezRodriguez, R.R.RodriguezNafria, M.M.NafriaAymerich, X.X.AymerichVerheyen, PeterPeterVerheyenSimoen, EddyEddySimoen2021-10-192021-10-1920111071-1023https://imec-publications.be/handle/20.500.12860/18475Processing dependences of channel hot-carrier degradation on strained-S- p-channel metal-oxide semiconductor field-effect transistorsJournal article