Goel, Sandeep K.Sandeep K.GoelMarinissen, Erik JanErik JanMarinissenSehgal, AnujaAnujaSehgalChakrabarty, KrishnenduKrishnenduChakrabarty2021-10-172021-10-1720090018-9340https://imec-publications.be/handle/20.500.12860/15358Testing of SOCs with hierarchical cores: common fallacies, test-access optimization, and test schedulingJournal article