Claeys, CorCorClaeysSimoen, EddyEddySimoenLukyanchikova, N.N.LukyanchikovaPetrichuk, M.M.PetrichukGarbar, N.N.Garbar2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/80Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETsOral presentation