Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

Gorchichko, MariaMariaGorchichkoZhang, E.X.E.X.ZhangWang, P.P.WangSchrimpf, R.R.SchrimpfReed, R.R.ReedFleetwood, D.M.D.M.FleetwoodBonaldo, S.S.BonaldoLinten, DimitriDimitriLintenMitard, JeromeJeromeMitard2021-10-282021-10-282020https://imec-publications.be/handle/20.500.12860/35192Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistorsProceedings paperhttp://www.nsrec.com/2020_session-c.html