Simoen, EddyEddySimoenO'Sullivan, BarryBarryO'SullivanRitzenthaler, RomainRomainRitzenthalerDentoni Litta, EugenioEugenioDentoni LittaSchram, TomTomSchramHoriguchi, NaotoNaotoHoriguchiClaeys, CorCorClaeys2021-10-262021-10-2620180018-9383https://imec-publications.be/handle/20.500.12860/31787TaN versus TiN metal gate input/output pMOSFETs: a low-frequency noise perspectiveJournal articlehttps://ieeexplore.ieee.org/document/8430549