Ruello, P.P.RuelloLomonosov, A.A.LomonosovAyouch, A.A.AyouchMechri, C.C.MechriBaklanov, MikhaïlMikhaïlBaklanovVerdonck, PatrickPatrickVerdonckZhao, LarryLarryZhaoGusev, V.V.Gusev2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19714Depth-profiling of the elastic and optical properties of submicrometer thick optically transparent films by picosecond ultrasonics inteferometryMeeting abstract