Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

van Dael, M.M.van DaelVerboven, P.P.VerbovenZanella, A.A.ZanellaSijbers, JanJanSijbersNicolai, B.B.Nicolai2021-10-272021-10-2720190925-5214https://imec-publications.be/handle/20.500.12860/34181Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomographyJournal articlehttps://www.sciencedirect.com/science/article/pii/S0925521418300565