Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices

Wellekens, DirkDirkWellekensVan Houdt, JanJanVan HoudtFaraone, LorenzoLorenzoFaraoneGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/461Write/erase degradation and disturb effects in source-side injection Flash EEPROM devicesProceedings paper