Gao, RuiRuiGaoJi, ZhigangZhigangJiManut, Azrif B.Azrif B.ManutZhang, Jian FuJian FuZhangFranco, JacopoJacopoFrancoHatta, Sharifah Wan MuhamadSharifah Wan MuhamadHattaZhang, Wei DongWei DongZhangKaczer, BenBenKaczerLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroeseneken2021-10-242021-10-2420170018-9383https://imec-publications.be/handle/20.500.12860/28367NBTI-generated defects in nanoscaled devices: fast characterization methodology and modelingJournal articlehttp://ieeexplore.ieee.org/document/8030148/