de Oliveira, AlbertoAlbertode OliveiraVeloso, AnabelaAnabelaVelosoClaeys, CorCorClaeysHoriguchi, NaotoNaotoHoriguchiSimoen, EddyEddySimoen2021-10-282021-10-2820200018-9383https://imec-publications.be/handle/20.500.12860/34987Low-frequency noise assessment on vertically stacked Si n-channel nanosheet FETs with different metal gatesJournal articlehttps://ieeexplore.ieee.org/document/9205835