Raghavan, NagaNagaRaghavanDegraeve, RobinRobinDegraeveFantini, AndreaAndreaFantiniGoux, LudovicLudovicGouxWouters, DirkDirkWoutersGroeseneken, GuidoGuidoGroesenekenJurczak, GosiaGosiaJurczak2021-10-212021-10-2120130741-3106https://imec-publications.be/handle/20.500.12860/22971Modeling the impact of reset depth on vacancy-induced filament perturbations in HfO2 RRAMJournal article