Alvarez, DavidDavidAlvarezDuhayon, NatasjaNatasjaDuhayonEyben, PierrePierreEybenFouchier, MarcMarcFouchierXu, MingweiMingweiXuVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/5946Two-dimensional carrier profiling using scanning probe microscopyOral presentation