Chen, YangyinYangyinChenPourtois, GeoffreyGeoffreyPourtoisClima, SergiuSergiuClimaGovoreanu, BogdanBogdanGovoreanuGoux, LudovicLudovicGouxFantini, AndreaAndreaFantiniDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenWouters, DirkDirkWoutersJurczak, GosiaGosiaJurczak2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20447Hf cap thickness dependence in bipolar-switching TiN\HfO2\Hf\TiN RRAM deviceMeeting abstract