A proper approach to characterize retention-after-cycling in 3D-Flash devices

Qiao, FengyingFengyingQiaoArreghini, AntonioAntonioArreghiniBlomme, PieterPieterBlommeVan den Bosch, GeertGeertVan den BoschPan, LiyangLiyangPanXu, JunJunXuVan Houdt, JanJanVan Houdt2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22964A proper approach to characterize retention-after-cycling in 3D-Flash devicesProceedings paper