Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations

Bronckers, StephaneStephaneBronckersVandersteen, GerdGerdVandersteenSoens, CharlotteCharlotteSoensVan der Plas, GeertGeertVan der PlasRolain, YvesYvesRolain2021-10-162021-10-162007-05https://imec-publications.be/handle/20.500.12860/11804Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbationsProceedings paper