Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

Amat, EsteveEsteveAmatKauerauf, ThomasThomasKaueraufDegraeve, RobinRobinDegraeveRodríguez, RosanaRosanaRodríguezNafría, MontseMontseNafríaAymerich, XavierXavierAymerichGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820100894-3370https://imec-publications.be/handle/20.500.12860/16650Simulation of the hot-carrier degradation in short channel transitors with high-K dielectricJournal article