Low frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETs

Vasina, PetrPetrVasinaSimoen, EddyEddySimoenClaeys, CorCorClaeysSikula, J.J.Sikula2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/983Low frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETsProceedings paper