Beyer, GeraldGeraldBeyerDemuynck, StevenStevenDemuynckStucchi, MicheleMicheleStucchiTokei, ZsoltZsoltTokei2021-10-172021-10-1720090038-111Xhttps://imec-publications.be/handle/20.500.12860/14985The reliability margin of interconnects for advanced memory technologiesJournal articlehttp://www.electroiq.com/index/display/semiconductors-article-display/360523/articles/solid-state-technology/volume-52/issue-5/f