An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors

Chien, Yu-ChiehYu-ChiehChienLondono Ramirez, HoracioHoracioLondono RamirezKuo, Chuan-WeiChuan-WeiKuoTsao, Yu-ChingYu-ChingTsaoNag, ManojManojNagChang, Ting-ChangTing-ChangChangAng, Kah-WeeKah-WeeAng2022-06-232021-11-022022-06-2320210018-9383WOS:000652799800019https://imec-publications.be/handle/20.500.12860/37909An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect TransistorsJournal article10.1109/TED.2021.3072878WOS:000652799800019THIN-FILM TRANSISTORSTHRESHOLD VOLTAGESERIES RESISTANCEMOBILITYCRYSTALLINEMODEL