Ronse, KurtKurtRonse2025-07-072024-11-162025-07-072024978-1-5106-8288-70277-786XWOS:001327624200002https://imec-publications.be/handle/20.500.12860/44793High NA EUV patterning ecosystem readiness to continue the logic scaling roadmapProceedings paper10.1117/12.3030694978-1-5106-8289-4WOS:001327624200002