Zhang, JennyJennyZhangSii, H. K.H. K.SiiGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5867Generation of hole traps in silicon dioxidesProceedings paper