Ceric, HajdinHajdinCericZahedmanesh, HoumanHoumanZahedmaneshCroes, KristofKristofCroes2021-10-272021-10-2720190026-2714https://imec-publications.be/handle/20.500.12860/32674Analysis of electromigration failure of nano-interconnects through a combination of modeling and experimental methodsJournal articlehttps://doi.org/10.1016/j.microrel.2019.06.054