Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Noltsis, MichalisMichalisNoltsisMaragkoudaki, EleniEleniMaragkoudakiRodopoulos, DimitriosDimitriosRodopoulosCatthoor, FranckyFranckyCatthoorSoudris, DimitriosDimitriosSoudris2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29086Failure probability of a FinFET-based SRAM cell utilizing the most probable failure pointProceedings paperhttp://ieeexplore.ieee.org/document/8106967/