Origin of the deep reset and low variability of pulse-programmed W\Al2O3\TiW\Cu CBRAM device

Belmonte, AttilioAttilioBelmonteDegraeve, RobinRobinDegraeveFantini, AndreaAndreaFantiniKim, WoosikWoosikKimHoussa, MichelMichelHoussaJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGoux2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23534Origin of the deep reset and low variability of pulse-programmed W\Al2O3\TiW\Cu CBRAM deviceProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6849356&contentType=Conference+Publications