Understanding the impact of time-dependent random variability on analog ICs: from single transistor measurements to circuit simulations

Simicic, MarkoMarkoSimicicWeckx, PieterPieterWeckxParvais, BertrandBertrandParvaisRoussel, PhilippePhilippeRousselKaczer, BenBenKaczerGielen, GeorgesGeorgesGielen2021-10-272021-10-2720191063-8210https://imec-publications.be/handle/20.500.12860/34004Understanding the impact of time-dependent random variability on analog ICs: from single transistor measurements to circuit simulationsJournal articlehttps://ieeexplore.ieee.org/document/8556027